By Topic

Carbon nanotubes synthesized by plasma enhanced CVD: Preparation for measurements of their electrical properties for application in pressure sensor

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Richard Ficek ; Brno University of Technology, Faculty of Electrical Engineering and Communication, Department of Microelectronics, Údolní 53, CZ-60200 Brno, Czech Republic. Tel: +420 605 860 810, Fax: +420 541 146 298, E-mail: Richard.Ficek@phd.feec.vutbr.cz ; Radimir Vrba ; Bo-Hyun Kim ; Stephen M. Goodnick
more authors

Carbon nanotubes (CNTs) were synthesized in atmospheric pressure microwave plasma torch in the mixture of argon, methane and hydrogen on the silicon substrate with SiO2 overlayer and a thin top iron film serving as a catalyst. This deposition technique is unique because of its simplicity and high CNT growth rate but it is still under investigation as concerns exits around its reproducibility. CNTs were deposited with the future prospect of their applications or further characterization that might require CNTs in the form of suspension or powder. One of the research directions includes measurements of CNT electrical properties such as their current-voltage (I-V) characteristics. Preparation of solutions with well dispersed CNTs was studied using various liquids (distilled water, ethyl alcohol) and ultrasonication. Dried drops of these solutions were investigated by scanning electron microscopy (SEM) and atomic force microscopy (AFM) in order to assess CNT appearance and dispersion. Electrical measurement chips with gold electrodes were prepared by electron lithography. CNTs were placed on the chips by dropping their solution and the I-V characteristics may be measured by contacting the electrodes bridged by CNTs

Published in:

2006 International Symposium on Communications and Information Technologies

Date of Conference:

18-20 Oct. 2006