Cart (Loading....) | Create Account
Close category search window
 

Estimation of Sensitive Equipment Disruptions Due to Voltage Sags

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chan-Nan Lu ; Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung ; Cheng-Chieh Shen

This paper presents a method for predicting the number of equipment disruptions due to voltage sags in a unit of time based on a concept described in IEC 61000-3-7. The proposed method uses the probabilistic distributions of system disturbance and equipment immunity indices obtained from a unified fuzzy inference engine to represent the disturbance severity and equipment susceptibility of voltage sags. It takes stochastic behavior of service performance into account in the estimation of equipment disruption. The proposed framework is also applicable if other power-quality indices, such as the voltage sag energy index and voltage sag severity index, are adopted. It can be used as an alternative for performing voltage sag coordination and financial analysis

Published in:

Power Delivery, IEEE Transactions on  (Volume:22 ,  Issue: 2 )

Date of Publication:

April 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.