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Dielectric properties and microstructure of (Sr.Ca)TiO3-based boundary layer capacitor materials

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5 Author(s)
Woon-Shik Choi ; Dept. of Electr. Eng., Kwangwoon Univ., Seoul, South Korea ; Chung-Hyeok Kim ; Joon-Ung Lee ; Choon-Bae Park
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The dielectric properties and the microstructure of (Sr.Ca)TiO3-based boundary layer (BL) capacitor materials were investigated. (Sr.Ca)TiO3-based compositions were fired at 1350°C in a N2 atmosphere to get the base semiconducting ceramics. The metal oxides of CuO were printed on the semiconducting ceramics and fired at 1200°C for the subsequent grain boundary diffusion. The grain size of the semiconducting ceramics was 20~40 μm and the apparent permittivity of the resulting material varied between 2×104 and 3×104

Published in:

Properties and Applications of Dielectric Materials, 1994., Proceedings of the 4th International Conference on  (Volume:1 )

Date of Conference:

3-8 Jul 1994

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