The Determination of On-Wafer Noise Parameters at W-Band

A new procedure for determining the noise parameters of on-wafer devices at W-band is presented. In this procedure the noise parameters of the device (DUT) are de-embedded using correlation matrices. The first reported noise parameter results for an on-wafer attenuator at 94GHz are also presented. These measured noise parameters show good agreement to those calculated from the DUT's scattering parameters.