Cart (Loading....) | Create Account
Close category search window

Scattering-Model-Based Methods for TOA Location in NLOS Environments

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Al-Jazzar, S. ; Dept. of Electr. & Comput. Eng., Hashemite Univ., Zarqa ; Caffery, J. ; Heung-Ryeol You

In this paper, we address methods of mitigating one of the major issues affecting wireless location accuracy in land mobile terrestrial environments: nonline-of-sight (NLOS) propagation. In order to improve location accuracy under such conditions, we propose a novel methodology for NLOS environments based on the use of scattering models to classify propagation environments. The scattering models allow modeling of the NLOS error so that the NLOS effect can be incorporated into a location algorithm. Through the use of the scattering models, we develop three novel location techniques based on the statistics of measured ranges via moment matching, the expectation maximization algorithm, and a Bayesian algorithm. Simulation results and discussion are given to illustrate the performance in typical NLOS environments. The results show that the algorithms provide improvement over traditional location algorithms

Published in:

Vehicular Technology, IEEE Transactions on  (Volume:56 ,  Issue: 2 )

Date of Publication:

March 2007

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.