By Topic

FDTD Subcell Modeling of the Inner Conductor of the Coaxial Feed: Accuracy and Convergence Analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Hajiaboli, A. ; Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, Que. ; Popovic, M.

In this paper, we analyze the method of exciting and truncating the coaxial probe used to excite an electromagnetically coupled patch antenna. The goal of the analysis is to avoid the unstable and unreliable behavior of finite-difference time-domain (FDTD) solution. The model considered here is based on the subcell thin wire modeling of inner conductor of a coaxial probe. Two main categories of structures and excitation models are considered. In the first category, the truncated thin wire is separated from the absorbing boundary by two FDTD cells, for several excitation models and their location along the wire. In the second category, the thin wire is extended into the absorbing boundary, and both the hard and the resistive source models are investigated. The comparison of the results for the two aforementioned categories of the FDTD coaxial probe feeds may be of particular interest to computational electromagnetics community, as it may yield insight into the limitations of the most commercial software packages which do not allow for extension of the coaxial probe model into the absorbing boundary

Published in:

Magnetics, IEEE Transactions on  (Volume:43 ,  Issue: 4 )