IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Image Processing, 1994. Proce ... Help

Parameter estimation and segmentation of noisy or textured images using the EM algorithm and MPM estimation

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Comer, M.L. ; Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA ; Delp, E.J.

Presents a new algorithm for segmentation of noisy or textured images using the expectation-maximization (EM) algorithm for estimating parameters of the probability mass function of the pixel class labels and the maximization of the posterior marginals (MPM) criterion for the segmentation operation. A Markov random field (MRF) model is used for the pixel class labels. The authors present experimental results demonstrating the use of the new algorithm on synthetic images and medical imagery

Published in:
Image Processing, 1994. Proceedings. ICIP-94., IEEE International Conference  (Volume:2 )

Date of Conference: 13-16 Nov 1994

Page(s):
650 - 654 vol.2
Meeting Date :
13 Nov 1994-16 Nov 1994
Print ISBN:
0-8186-6952-7
INSPEC Accession Number:
5010237
Conference Location :
Austin, TX
Digital Object Identifier :
10.1109/ICIP.1994.413651
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.