By Topic

Field emission of individual nanotubes studied by in situ transmission electron microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Xue-Dong Bai ; Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, P. O. Box 603-20, Beijing 100080, China. Phone:(8610)8264 8032, Fax:(8610)8264 9228, e-mail: xdbai@aphy.iphy.ac.cn ; Zhi Xu ; En-Ge Wang

The field emission of individual multiwalled carbon nanotubes is studied using transmission electron microscope (TEM). A direct link between field emission and emitter structure and real work function at emitter tip is established. The result is modeled according to the Fowler-Nordheim equation

Published in:

2006 19th International Vacuum Nanoelectronics Conference

Date of Conference:

July 2006