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Nanostructured Materials Studied by Means of the Computed Field Ion Image Tomography (CFIIT)

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4 Author(s)
Wille, C. ; Institut fuer Materialphysik, Gottingen Univ. ; Al-Kassab, T. ; Heinrich, A. ; Kirchheim, R.

A new technique for transmission electron microscopy and atom probe tomography of nanocrystalline materials is developed based on field ion microscopy (FIM). The computed field ion image tomography (cFIIT) uses stacked field ion micrographs to reconstruct volumes 102 to 103 times larger than those from tomographic atom probe. This method also makes it possible to create "virtual" FIM images in order to visualise nanoscopic microstructures and provides orientation information to obtain the distances between grain boundary precipitates

Published in:

Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International

Date of Conference:

July 2006