Analytical results to account for delay measurement errors of high-speed VLSI devices

The transmission line effect in modern automatic test equipment (ATE) has been a major concern in measuring the timing of VLSI chips. The new version of test head has tried to terminate the transmission lines in matched loads at the comparator ends of the lines. This has eliminated the ringing effect. However, the new loading conditions for measurements are not likely to be according to specifications. Analytical results have been developed to correct the measurement errors incurred by different loading conditions. Chip-to-chip process variations have been incorporated.<
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