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Uncertainties of VNA S-Parameter Measurements Applying the TAN Self-Calibration Method

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1 Author(s)
Ulrich Stumper ; Phys.-Technische Bundesanstalt, Braunschweig

For the seven-term general through-attenuator-network (TAN) self-calibration method of a four-sampler vector network analyzer and for all derived calibration methods such as through-line-network, through-reflect-line, through-reflect-match, through-attenuator-reflect, or through-match-network, expressions for the deviations of the measured S-parameters of two-port test objects (device under test) from their true values, which are caused by deviations of the S-parameters of nonideal calibration elements ("standards") from their ideal values, are presented. These sensitivity coefficients can be used for establishing the type-B uncertainty budget for S-parameter measurements

Published in:

IEEE Transactions on Instrumentation and Measurement  (Volume:56 ,  Issue: 2 )