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On-Wafer Measurement of Transistor Noise Parameters at NIST

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2 Author(s)
Randa, J. ; Electromagn. Div., National Inst. of Stand. & Technol., Boulder, CO ; Walker, D.K.

The National Institute of Standards and Technology has developed the capability to measure noise parameters on a wafer in the 1-12.4-GHz range. The authors describe the measurement method and the uncertainty analysis and present results of measurements on a highly reflective transistor. Typical standard uncertainties are within the range of 20-25 K in Tmin, which is the minimum transistor noise temperature, and about 0.03 in the magnitude of Gammaopt, which is the reflection coefficient for which Tmin occurs

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:56 ,  Issue: 2 )

Date of Publication:

April 2007

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