IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > ARFTG Conference Digest-Sprin ... Help

Improvement of the Electronic Mode Stir Chamber Automated Data Acquisition System for Conducting Electromagnetic Susceptibility Tests

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Johnson, Eric A. ; Phillips Laboratory/WSM, 3550 Aberdeen Ave SE, Kirtland AFB, NM 87117, (505) 846-4608

An automated data acquisition system implements the Electronic Mode Stir Chamber (EMSC) technique with modifications made to transition it from a research and development system to a production qualify sysfem. The user interface the communication between the software and the instruments were improved by transferring the software into the LabWindows/CVI environment.

Published in:
ARFTG Conference Digest-Spring, 47th  (Volume:29 )

Date of Conference: June 1996

Page(s):
164 - 168
Print ISBN:
0-7803-5686-1
Conference Location :
San Francisco, CA, USA
Digital Object Identifier :
10.1109/ARFTG.1996.327178
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.