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Automated Measurement of the Bit-Error Rate as a Function of Signal-to-Noise Ratio for Microwave Communications Systems

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3 Author(s)
Robert J. Kerczewski ; National Aeronautics and Space Administration, Lewis Research Center, Cleveland, Ohio 44135 ; Elaine S. Daugherty ; Ihor Kramarchuk

The performance of microwave systems and components for digital data transmission can be characterized by a plot of the bit-error rate as a function of the signal-to-noise ratio (or Eb/No). Methods for the efficient automated measurement of bit-error rates and signal-to-noise ratios, developed at NASA Lewis Research Center, are described. Noise measurement considerations and time requirements for measurement accuracy, as well as computer control and data processing methods, are discussed.

Published in:

ARFTG Conference Digest-Spring, 29th  (Volume:11 )

Date of Conference:

June 1987