Modeling Effects of Random Rough Interface on Power Absorption Between Dielectric and Conductive Medium in 3-D Problem

We study the effects of a random rough surface on the power absorption between a dielectric and conductive medium in a 3-D configuration where the surface height varies in both horizontal directions. The analytic small perturbation method of second order and numerical T-matrix method are used. The absorption depends on the root mean square height, correlation length, and correlation function of the random rough surface. A closed-form expression of power absorption enhancement factor is obtained from small perturbation method of second order. Results show that the T-matrix method agrees with the small perturbation method for rough surfaces with a small slope. We further compare the 3-D results to the previous 2-D results and show significant difference. The power absorption enhancement factor exhibits saturation for the Gaussian correlation function, but not for the exponential correlation function