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Job shop scheduling with multiple resources and an application to a semiconductor testing facility

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2 Author(s)
Chen, T.-R. ; Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA ; Hsia, T.C.

There are many cases of manufacturing problems in which a job requires more than one resource to be simultaneously available for processing. In this paper, we present a methodology for solving job shop scheduling problems with simultaneous resources. An application of the methodology to an IC test facility, where wafer sort and final test are performed, is presented

Published in:

Decision and Control, 1994., Proceedings of the 33rd IEEE Conference on  (Volume:2 )

Date of Conference:

14-16 Dec 1994