IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Journals & Magazines > Power Apparatus and Systems, ...> Volume:PAS-102 Issue:10 Help

Recent Experience with Synthetic Circuits for Capacitive Current Switching Tests on HV Circuit-Breakers

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Manganaro, S. ; CESI-Centro Elettrotecnico Sperimentale Italiano ; Romiti, A. ; Rovelli, S.

The phenomena related to capacitive current switching are briefly summarized and the resulting requirements for such tests carried out by synthetic methods are discussed.

Published in:
Power Apparatus and Systems, IEEE Transactions on  (Volume:PAS-102 ,  Issue: 10 )

Date of Publication: Oct. 1983

Page(s):
3329 - 3337
ISSN :
0018-9510
Digital Object Identifier :
10.1109/TPAS.1983.317829
Product Type:
Journals & Magazines
Date of Current Version :
26 February 2007
Issue Date :
Oct. 1983

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.