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Comparison of voltage and current testing of analogue and mixed-signal circuits

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1 Author(s)
Al-Qutayri, M.A. ; Dept. of Electron. & Electr. Eng., De Montfort Univ., Leicester, UK

The author presents a time-domain testing technique for analogue and mixed-signal circuits. The circuit-under-test (CUT) is simulated by a pseudo-random-binary sequence (PRBS) signal and both the voltage and supply current (Iddq) responses are measured. Both measurements are subsequently analyzed to detect the presence of a fault and to establish which measurement achieves higher confidence in the detection. The technique can test mixed-signal circuits in a unified manner and detecting soft and catastrophic faults

Published in:

ASIC Conference and Exhibit, 1993. Proceedings., Sixth Annual IEEE International

Date of Conference:

27 Sep-1 Oct 1993