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Test tradeoffs in ASIC design: tutorial

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1 Author(s)
Rose, K. ; ECSE Dept., Rensselaer Polytech. Inst., Troy, NY, USA

In this tutorial test fundamentals are reviewed to introduce key concepts in design for test and built-in self-test. Design for test and built-in self-test are illustrated by their implementation in single-chip conversion of a PCB design and a floating point co-processor design, respectively. The savings in design effort when testability is part of the initial design is stressed

Published in:

ASIC Conference and Exhibit, 1993. Proceedings., Sixth Annual IEEE International

Date of Conference:

27 Sep-1 Oct 1993