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Distributed Genetic Algorithm of Test Generation For Digital Circuits

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3 Author(s)
Y. A. Skobtsov ; Donetsk National Technical University, Artema Str., 58, Donetsk, 83000, UKRAINE, E-mail: skobtsov@kita.dgtu.donetsk.ua ; A. i. El-Khatib ; D. E. Ivanov

The distributed genetic algorithms are considered for problem of test generation. The different forms of parallelization of genetic algorithms are investigated for test generation

Published in:

2006 International Biennial Baltic Electronics Conference

Date of Conference:

2-4 Oct. 2006