Referenced Items are not available for this document.
The distributed genetic algorithms are considered for problem of test generation. The different forms of parallelization of genetic algorithms are investigated for test generation
Published in:
Baltic Electronics Conference, 2006 International
Date of Conference: 2-4 Oct. 2006
- Page(s):
- 1 - 4
- ISSN :
- 1736-3705
- E-ISBN :
- 1-4244-0415-0
- Print ISBN:
- 1-4244-0414-2
- INSPEC Accession Number:
- 9428953
- Conference Location :
- Tallinn
- Digital Object Identifier :
- 10.1109/BEC.2006.311096
- Product Type:
- Conference Publications
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