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An ESD Protection Device Simulation-Design Methodology based on MEDICI

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3 Author(s)
Bin Li ; Dept. of Microelectron., South China Univ. of Technol., Guangzhou ; Ruoyu Li ; Hongwei Luo

In this paper, MEDICI was used to simulate ESD device by coupling the electrothermal effects. The effects of size parameters on the ESD robustness are discussed. The response time of ESD protection circuit is also analyzed. Tape-outs under different processes exhibited satisfactory ESD robustness, with higher than 4000V in CSMC 0.6 mum process and 3500V in HHNEC 0.25 mum process. It is testified that this methodology is effective

Published in:

2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings

Date of Conference:

23-26 Oct. 2006