By Topic

Reduced Uncertainty of Measurement for Vector Network Analysers Employing Regression During Calibration

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Salter, M.J. ; Centre for Electromagn. & Time Metrol., National Phys. Lab., Teddington ; Ridler, N.M. ; Harris, P.M.

We formulate the calibration process for a one-port vector network analyser (VNA) as a regression problem making full use of the uncertainty information available for the indicated and 'true' voltage reflection coefficients (VRCs) of the standards. The benefit of over-determining the calibration in terms or reduced uncertainties is demonstrated for VRC measurements at RF frequencies

Published in:

Precision Electromagnetic Measurements Digest, 2004 Conference on

Date of Conference:

June 2004