Referenced Items are not available for this document.
Many recent ASICs include both analog and digital circuits, called mixed-signal integral circuits, to realize required functions on one chip. The comparator circuit is a principal element in the mixed-signal integrated circuit. In this paper we discuss a method for testing CMOS comparators. The method is current testing using both the upper limit and the lower limit. Bridging faults and break faults are assumed on the circuit layout and are analyzed by a circuit simulator. We examine the efficiency of fault detection by current testing. The result of the test shows that the proposed testing method has the highly fault coverage more than 94 percent
Published in:
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
(Volume:5
)
Date of Conference: 30 May-2 Jun 1994
- Page(s):
- 77 - 80 vol.5
- Meeting Date :
- 30 May 1994-02 Jun 1994
- Print ISBN:
- 0-7803-1915-X
- INSPEC Accession Number:
- 5063806
- Conference Location :
- London
- Digital Object Identifier :
- 10.1109/ISCAS.1994.409304
- Product Type:
- Conference Publications
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
