Fault detection in linear bipolar ICs: comparative results between power supply current and output voltage measurements

Fault detection in linear bipolar integrated circuits using power supply current measurements is investigated. The most prevalent, catastrophic and parametric faults, have been modelled for the representative (741 type) op amp. The circuit is simulated in both linear and non-linear operations. Comparative results between power supply current and output voltage measurements are given, showing the improvement in fault coverage by the use of the current sensing method.<
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