Cart (Loading....) | Create Account
Close category search window

A Three-Dimensional Finite-Difference Solution of the External Response of an Aircraft to a Complex Transient EM Environment: Part II-Comparison of Predictions and Measurements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kunz, K.S. ; Mission Research Corporation, P. O. Box 8693, Albuquerque, NM 87108. (505) 265-8306 ; Kuan-Min Lee

Experimental charge and current measurements have recently been performed on an aircraft when it was exposed to the transient electromagnetic field of an electromagnetic-pulse (EMP) simulator. These new data allow a test of the predictive capabilities of the three-dimensional finite-difference method for realistic aircraft aircraftsimulator-test problems. Comparisons made between measurements and predictions show that the three-dimensional finite-difference technique provides reasonably accurate predictions for the induced currents and charges on a complex object responding to an applied transient electromagnetic field in the presence of a lossy earth.

Published in:

Electromagnetic Compatibility, IEEE Transactions on  (Volume:EMC-20 ,  Issue: 2 )

Date of Publication:

May 1978

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.