Scheduled System Maintenance:
On May 6th, single article purchases and IEEE account management will be unavailable from 8:00 AM - 5:00 PM ET (12:00 - 21:00 UTC). We apologize for the inconvenience.
By Topic

Resolution evaluation of ultrasonic diagnosis tools for electrical insulation devices and the detection of electrical trees

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Ueno, H. ; Inst. for High Voltage Technol., RWTH Aachen Univ. ; Walter, P. ; Cornelissen, C. ; Schnettler, A.

Ultrasound is a well-known diagnosis tool that can be used for the condition assessment of insulating systems. For this special purpose, various investigations on the detectability of the included inhomogeneities are performed: The resolution of ultrasonic measurements on high voltage insulations has been evaluated by using standardized Landolt rings in silicone rubber and epoxy resin. Although a dependency exists on the ring position, the diagnostic system that is used is able to image the gap with a sub-millimeter size. In other words, the system has recognition ability for two different objects close to such a distance. Regarding detectability, it has been found that in addition to ball-shaped inhomogeneities, the system can also detect thin fibrous objects with a diameter of a few micrometers. Finally, the results are used to detect and characterize electrical trees in silicone rubber

Published in:

Dielectrics and Electrical Insulation, IEEE Transactions on  (Volume:14 ,  Issue: 1 )