Cart (Loading....) | Create Account
Close category search window

IC variability minimization using a new Cp and Cpk based variability/performance measure

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Aftab, S.A. ; Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA ; Styblinski, M.A.

A new performance measure, based on the capability indices Cp and Cpk (commonly used in process control), is proposed for general circuit Design for Quality. It overcomes some of the critical limitations of the traditional quadratic loss function (e.g., that of Taguchi) and leads to the creation of a new methodology for statistical circuit design. It also allows for the automation of the manual two-stage variability minimization/tuning methodology, and gives a concrete interpretation to the “goodness” of a circuit in easy to understand terms. Successful IC variability/performance optimization examples are presented

Published in:

Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on  (Volume:1 )

Date of Conference:

30 May-2 Jun 1994

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.