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A CAD environment for performance and yield driven circuit design employing electromagnetic field simulators

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4 Author(s)
J. W. Bandler ; Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada ; R. M. Biernacki ; S. H. Chen ; P. A. Grobelny

In this paper we describe a CAD environment for performance and yield driven circuit design with electromagnetic (EM) field simulations employed within the optimization loop. Microstrip structures are accurately simulated and their responses are incorporated into the overall circuit analysis. We unify the component level interpolation technique, devised to handle discretization of geometrical parameters, and the modeling technique used to lighten the computational burden of statistical design centering. We discuss the organization and utilization of the data base system integrated with the modeling technique. We demonstrate the feasibility and benefits of performance and yield optimization with EM simulations

Published in:

Proceedings of IEEE International Symposium on Circuits and Systems - ISCAS '94  (Volume:1 )

Date of Conference:

30 May-2 Jun 1994