System Maintenance:
There may be intermittent impact on performance while updates are in progress. We apologize for the inconvenience.
By Topic

Design and FDTD analysis of open-ended coaxial probes for broadband high-temperature dielectric properties measurements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Bringhurst, S. ; Dept. of Electr. Eng., Utah Univ., Salt Lake City, UT, USA ; Iskander, H.F. ; Gartside, P.

In conjunction with ongoing research in the area of microwave processing of materials and, in particular, in the microwave sintering of ceramics, the authors found it necessary to make dielectric properties measurements at temperatures as high as 1000/spl deg/C. The authors have developed a new metallized ceramic coaxial probe for broadband, high-temperature dielectric properties measurements. Initial experience with the probe showed good experimental results in the frequency range from 500 MHz to 3 GHz, and for temperatures up to 1000/spl deg/C. To help further optimize the design of the probe, its performance was numerically simulated using FDTD. A TEM mode is excited in the coaxial feed, and the propagation, fields penetration in the sample, and the reflection coefficients were calculated using FDTD. Several probe designs were examined and the ability to make accurate and broadband measurements were examined, based on the obtained numerical results. Numerical and and graphical results illustrating some the basic guidelines of probe design, and its effective and accurate use in making dielectric measurements are presented. Parameters such as bandwidth, sample thickness, probe length, probe sensitivity to various properties of materials, and methods to increase the penetration of fields into the sample under test are discussed.<>

Published in:

Antennas and Propagation Society International Symposium, 1994. AP-S. Digest  (Volume:2 )

Date of Conference:

20-24 June 1994