By Topic

Column Parity Row Selection (CPRS) BIST Diagnosis Technique: Modeling and Analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Li, J.C.-M. ; Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei ; Hung-Mao Lin ; Fang-Min Wang

Column selection row parity (CPRS) diagnosis is an X-tolerant and low aliasing technique that is suitable for the BIST environment. A row selection LFSR randomly selects outputs of multiple scan chains so that unknowns can be tolerated. Column and row parities of selected outputs are observed to solve linear equations for the error positions. Experimental data show that CPRS achieves nearly perfect diagnosis, even in the presence of 1 percent unknowns. CPRS compresses the diagnosis data because only parities of circuit responses, instead of responses themselves, are observed. Two error distribution models (scattered and clustered) are developed and analyzed to show the effectiveness of CPRS. The analytical results are demonstrated to be accurate by more than 10,000 experiments

Published in:

Computers, IEEE Transactions on  (Volume:56 ,  Issue: 3 )