Cart (Loading....) | Create Account
Close category search window

Pattern Pruner: Automatic Pattern Size Reduction Method that Uses Computational Intelligence-Based Testing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Liau Chee Hong, E. ; Infineon Technol. AG, Neubiberg ; Menke, M. ; Janik, T. ; Schmitt-Landsiedel, D.

This paper describes a novel computational intelligence test method with automatic pattern size reduction algorithm - Pattern Pruner for improving the efficiency of localization for the design weaknesses and/or faults using state-of-art automatic test equipment (ATE). Computational intelligence and Pattern Pruner software implemented on semiconductor automatic test equipment allows finding worst case test pattern and identifying design weaknesses. This is demonstrated by detection of a hang-up in a pseudo-SRAM test chip with asynchronous operation and hidden refresh, package parasitics are found to be the cause of the failure, and debugging is performed by modification of the power network

Published in:

Test Conference, 2006. ITC '06. IEEE International

Date of Conference:

Oct. 2006

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.