Cart (Loading....) | Create Account
Close category search window
 

Cost-Sensitive-Data Preprocessing for Mining Customer Relationship Management Databases

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Junfeng Pan ; Hong Kong Univ. of Sci. & Technol., Kowloon ; Qiang Yang ; Yiming Yang ; Lei Li
more authors

A staged-framework for data preprocessing has been developed to support data mining and help service providers identify customers who might switch to a competitor. The framework pushes the cost sensitivity and data imbalance of customer retention data into the data preprocessing itself. Tests using data set from the ACM KDD Cup 1998 showed that the framework outperformed the winner of that data mining and knowledge discovery competition. The framework has also been incorporated into a software system, called ED-Money. To demonstrate the framework's ability to predict customer attrition with high accuracy, it was applied to some benchmark data and to a real customer attrition data set from a large Chinese mobile telecommunications company

Published in:

Intelligent Systems, IEEE  (Volume:22 ,  Issue: 1 )

Date of Publication:

Jan.-Feb. 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.