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Single Event Upset Characterization of the Virtex-4 Field Programmable Gate Array Using Proton Irradiation

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3 Author(s)
David M. Hiemstra ; Senior Member IEEE, MDA, Brampton, Ontario L6S 4J3 Canada. telephone: 905-790-2800, e-mail: ; Fayez Chayab ; Zaeem Mohammed

Proton induced SEU cross-sections of functional blocks and the SRAM which stores the logic configuration of the Virtex-4 FPGA are presented. Upset rates in the space radiation environment are estimated

Published in:

2006 IEEE Radiation Effects Data Workshop

Date of Conference:

July 2006