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Proton Radiation Test Results on COTS-Based Electronic Devices for NASA-Johnson Space Center Spaceflight Projects

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4 Author(s)
Kouba, C.K. ; Avionic Syst. Div., NASA, Houston, TX ; Nguyen, K. ; O'Neill, P. ; Bailey, C.

This paper reports the results of recent single event effect (SEE) testing on a variety of commercial-off-the-shelf (COTS) based microelectronic hardware after exposure to 200 Mega-electron-volt (MeV) protons. This hardware was being evaluated for use in both Space Shuttle and International Space Station (ISS) applications. Our approach, test protocol and analysis methodology are discussed

Published in:

Radiation Effects Data Workshop, 2006 IEEE

Date of Conference:

July 2006