Close category search window
 

Statistical Approach to the Power Testing of High Voltage Circuit Breakers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Brasca, E. ; CESI-Centro Elettrotecnico Sperimentale Italiano ; Dellera, L. ; Rovelli, S.

The random behaviour of circuit breakers requires the application of testing methods based on statistical approach. Technical information provided by different testing procedures are compared. Experience achieved during years of comparison tests between direct and synthetic methods is discussed on statistical basis. The "up and down" method is proposed as a suitable mean to investigate the circuit-breaker performance with small samples. The power of this method is stressed to explore the low failure probability region.

Published in:
Power Apparatus and Systems, IEEE Transactions on  (Volume:PAS-91 ,  Issue: 3 )

Date of Publication: May 1972

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.