By Topic

Usage and Checking of the Theoretical Relations Between Fields, Currents, and Excitation Functions in Radio Frequencies in the Case of Short Test Lines

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)

This paper deals with the problem of interpretation of the RI level generated by a short test line. It is shown that matching, on one or both ends of such a line, gives several advantages with respect to the classical solution of an open line in HF; the HF coupling and matching circuits are described.

Published in:

IEEE Transactions on Power Apparatus and Systems  (Volume:PAS-88 ,  Issue: 10 )