Cart (Loading....) | Create Account
Close category search window
 

Utilization of Active Microwave Roughness Measurements to Improve Passive Microwave Soil Moisture Estimates Over Bare Soils

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Theis, S.W. ; Texas Instruments Incorporated, McKinney, TX ; Blanchard, B.J. ; Blanchard, A.J.

Investigators have researched operational microwave techniques for the remote estimation of soil moisture for sometime now. Both active and passive microwave sensors respond to variations in soil moisture, but also respond to vegetation and roughness parameters. This has led to research in multisensor techniques which account for the interference. Previously, techniques have been developed which used visible and infrared bands (similar to Landsat) to compensate for the vegetation masking on the L-band passive radiometer's response to soil moisture. In contrast, this study compensates for the surface roughness effect by using microwave scatterometer data on the same L-band radiometer. It was found that the L-band radiometer's capability to estimate soil moisture over bare fields was significantly improved when surface roughness was accounted for with scatterometers.

Published in:

Geoscience and Remote Sensing, IEEE Transactions on  (Volume:GE-24 ,  Issue: 3 )

Date of Publication:

May 1986

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.