Cart (Loading....) | Create Account
Close category search window
 

Algorithms for Maximizing Printhead Utility Using Histogram Equalization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Sudhakar, R. ; Florida Atlantic University ; Kostopoulos, G. ; Leung, G.

This paper presents algorithms for extending the life of thermal array printheads. A major cause of thermal element fatigue is the uneven use of the print elements, which is due to the uneven dot distribution requirements in printing alphanumerics. To obtain a nearly uniform dot utilization an optimum algorithm for shifting the printed text was developed on a page basis. To this end, first, means were developed to determine the dot distribution of a given font set, second, the effect of printshifting by a few dot rows on the overall distribution was studied and third, algorithms were developed that lead to optimum printshifting. Finally, it is shown that with simple shifting strategies, the printhead life can be extended by about 105% at a negligible software cost.

Published in:

Consumer Electronics, IEEE Transactions on  (Volume:CE-33 ,  Issue: 4 )

Date of Publication:

Nov. 1987

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.