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Testing And Applications of Inverter-Free PLAs

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2 Author(s)
Rajski, J. ; McGill University ; Agarwal, V.K.

The testing properties of inverter-free PLAs make them ideal for application to totally self-checking and easily testable circuits. After a class of test patterns and masking relations for these new patterns are determined, a complete test set for single and multiple crosspoint faults can be easily generated. Moreover, the procedure does not require any fault simulation. The code space inputs detect all single and multiple faults in PLAs for totally self-checking circuits, even if the faults are not unidirectional. The test results can be used to analyze easily testable PLAs. With minor hardware changes in one-input decoder PLAs, the personality matrix will serve as a complete test set.

Published in:

Design & Test of Computers, IEEE  (Volume:4 ,  Issue: 6 )