By Topic

Achieving Accurate Timing Measurements on TTL/CMOS Devices

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Petrich, D. ; Micro Component Technology

Production TTL and CMOS timing measurements obtained between different test systems and between test systems and the bench setup often do not correlate or do not appear to be accurate even though the automatic test equipment system has subnanosecond accuracy. Errors of as much as 2 ns can occur with small-, medium-, and large-scale integration and with gate arrays using the new TTL and CMOS technologies. This represents a 100- percent error factor for these emerging products.

Published in:

Design & Test of Computers, IEEE  (Volume:3 ,  Issue: 4 )