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Inductive Fault Analysis of MOS Integrated Circuits

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3 Author(s)
Shen, J.P. ; Carnegie-Mellon University ; Maly, W. ; Ferguson, F.J.

Inductive Fault Analysis (IFA) is a systematic Procedure to predict all the faults that are likely to occur in MOS integrated circuit or subcircuit The three major steps of the IFA procedure are: (1) generation of Physical defects using statistical data from the fabrication process; (2) extraction of circuit-level faults caused by these defects; and (3) classification of faults types and ranking of faults based on their likelihood of occurrence Hence, given the layout of an IC, a fault model and a ranked fault list can be automatically generated which take into account the technology, layout, and process characteristics. The IFA procedure is illustrated by its applications to an example circuit. The results from this sample led to some very interesting observations regarding nonclassical faults.

Published in:

Design & Test of Computers, IEEE  (Volume:2 ,  Issue: 6 )