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A Basis for Setting Burn-in Yield Criteria

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2 Author(s)

This simple, useful, and practical approach to assess the cost benefits from using burned-in plastic ICs assumes a simple approximation for early life failure during burn-in and predicts the failure rate of the residual parts on the basis of yield percentage. Because product applications, end-user environment, and device quality vary, the simplicity of this method is obtained at the cost of some rigor. Nonetheless, the results are useful and are consistent with measured data.

Published in:

Design & Test of Computers, IEEE  (Volume:2 ,  Issue: 3 )