Cart (Loading....) | Create Account
Close category search window

Built-In Self-Test Trends in Motorola Microprocessors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)

The first built-in self-test feature in a Motorola sidered a ¿wart¿ until a RAM test application recast it as a ¿ feature.¿ Though the BIST approach¿an idea conceived as a way to reduce production costs for the MC6805 family¿did not meet its major design objective, the experience provided impetus for the development of BIST techniques for the MC6804P2, which met most of the objectives intended for the MC6805P2. The Motorola microprocessor family has come to incorporate a growing number of testability features; current devices typically employ a combination of BIST and other techniques. If present trends continue, transistor counts for microprocessor-related parts should approach 10 million within 10 years. The authors argue that structured design techniques offer the most promising prospects for solving the design and test problems resulting from this increase in complexity.

Published in:

Design & Test of Computers, IEEE  (Volume:2 ,  Issue: 2 )

Date of Publication:

April 1985

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.