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High-Crosstalk Robustness Transmission Line Interconnect in Si LSI using Zero-Crosstalk Structure

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5 Author(s)
Kimura, M. ; Integrated Res. Inst., Tokyo Inst. of Technol., Yokohama ; Ito, H. ; Sugita, H. ; Okada, K.
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This paper proposes a novel bus line structure using differential transmission lines, which equips high-density and high crosstalk-robustness. The feasibility of this structure is discussed from results of two-dimensional electromagnetic simulation and time-domain measurement. Measurement results show that the bus line has higher crosstalk robustness than that of the conventional co-planar line. The bus line can reduce effective density of 55% as compared with the conventional coplanar line

Published in:

Signal Propagation on Interconnects, 2006. IEEE Workshop on

Date of Conference:

9-12 May 2006