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Characterisation of electromagnetic susceptibility of integrated circuits using near-field scan

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3 Author(s)
A. Boyer ; Electron. Dept., Toulouse ; S. Bendhia ; E. Sicard

A susceptibility characterisation test for integrated circuits using a miniature magnetic near-field probe is described. The method is efficient up to a frequency of 6 GHz and maps immunity to radiated fields

Published in:

Electronics Letters  (Volume:43 ,  Issue: 1 )