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A voltage dependent capacitance model including effects of manufacturing process variabilities on voltage coefficients

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1 Author(s)
Ito, Akira ; Semicond. Sector, Harris Corp., Melbourne, FL, USA

A voltage dependent capacitance model, including the effects of process variations, has been developed using a voltage-controlled voltage source defined by a polynomial for Monte Carlo simulations of mixed-signal design applications. Each of the polynomial coefficients is defined by a simple first order polynomial using the process variables to accurately reflect the manufacturing process. The variability of voltage coefficient simulated by this mixed mode model is shown to be in good agreement with the empirical data

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:14 ,  Issue: 9 )

Date of Publication:

Sep 1995

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