Cart (Loading....) | Create Account
Close category search window
 

Local ratio cut and set covering partitioning for huge logic emulation systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Nan-Chi Chou ; Quickturn Syst. Inc., Mountain View, CA, USA ; Lung-Tien Liu ; Chung-Kuan Cheng ; Wei-Jin Dai
more authors

Given a system represented at gate level, we propose an algorithm mapping the design into the minimum number of FPGA's for logic emulation. We first devise a Local Ratio-cut clustering scheme to reduce the circuit complexity. Then a Set Covering partitioning approach, utilizing the paradigm of Espresso II, is proposed as an alternative to the widely adopted recursive partitioning paradigm. Experimental results have shown that our approach achieved significant improvement with much shorter run times compared to the recursive Fiduccia-Mattheyses approach on large designs. For instance, on a benchmark of 160 K gates and 90 K nets, we reduced the number of FPGA's required and the run time by 41 and 86%, respectively

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:14 ,  Issue: 9 )

Date of Publication:

Sep 1995

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.