Cart (Loading....) | Create Account
Close category search window
 

The Fundamental Noise Limit of Linear Amplifiers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Heffner, H. ; Stanford Electronics Laboratories, Stanford University, Calif.

If the uncertainty principle of quantum mechanics is applied to the process of signal measurement, two theorems relating to amplifier noise performance can be deduced. First, it can be shown that it is impossible to construct a linear noiseless amplifier. Second, if the amplifier is characterized as having additive white Gaussian noise, it can be shown that the minimum possible noise temperature of any linear amplifier is T.= In 2 -IIG -hv 1-1/ IG k In the limit of high gain G this expression reduces to that previously derived for the ideal maser and parametric amplifier. It is shown that the minimum noise amplifier does not degrade the signal but rather allows the use of an inaccurate detector to make measurements on an incoming signal to the greatest accuracy consistent with the uncertainty principle.

Published in:

Proceedings of the IRE  (Volume:50 ,  Issue: 7 )

Date of Publication:

July 1962

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.