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The Design of the Microwave T/R Module Automation Test System Based on the Embedded System

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3 Author(s)
Yang Wen ; Sch. of Autom. Eng., Univ. of Electron. Sci. Technol. of China, Chengdu ; Qin Kai-yu ; He Pi-yan

This paper describes the design principles of the automated test system for microwave T/R module, with the embedded system achieving the function control of the whole system. The system could implement automatic measurement of all the time domain and frequency domain parameters in the sixteen 32-channel modules using the single-connection multiple-measurement (SCMM) technique, and conduct automatic S-parameter test and error correction under both continuous wave and pulse according to presetted test programs. With the application of the embedded system, the system ranks a high flexibility, high reliability, open infrastructure and good scalability, and the performance specification has made it among the advanced products worldwide.

Published in:

Communications, Circuits and Systems Proceedings, 2006 International Conference on  (Volume:4 )

Date of Conference:

25-28 June 2006