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High Voltage Testing of GIS: Application of Frequency Tuned Resonant Test Sets and Return of Experience from On-site Tests

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2 Author(s)
Schichler, U. ; High Voltage Div., Siemens AG ; Wurster, M.

This paper deals with the on-site testing of GIS at high test frequencies generated by frequency tuned resonant test sets. The application of test frequencies of up to 300 Hz (see IEC 62271-203) showed no dependency on the breakdown voltage of the GIS insulation system. The publication also describes modern frequency tuned resonant test sets which enable efficient on-site testing. The return of experience from on-site testing of a state-of-the-art 245 kV GIS population is summarized

Published in:
Properties and applications of Dielectric Materials, 2006. 8th International Conference on

Date of Conference: June 2006

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